发明名称 Three-dimensional single transistor semiconductor memory device and methods for making same
摘要 Single-transistor memory cell including a three-dimensional capacitor and methods for fabricating the cell are disclosed. The method includes steps for defining a source and drain, forming a channel between the source and drain, and forming a gate area of a transistor. The method also includes forming a first and second capacitor plate of a three-dimensional capacitor coupled to the drain of the transistor. In one respect, the first capacitor plate may be formed substantially simultaneously with the step of forming the channel. Additionally, the second capacitor plate may be formed substantially simultaneously with the step of defining the gate area of the transistor. The capacitor may include a three-dimensional fin capacitor and the transistor may include, for example, a multi-gate field effect transistor, a fin field effect transistor, a tri-gate transistor, a Pi transistor, and a Omega transistor.
申请公布号 US2007117311(A1) 申请公布日期 2007.05.24
申请号 US20050286704 申请日期 2005.11.23
申请人 ADVANCED TECHNOLOGY DEVELOPMENT FACILITY, INC. 发明人 ZAMAN ROWNAK J.
分类号 H01L21/8242;H01L29/76 主分类号 H01L21/8242
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