| 摘要 |
A method of determining frequency components of jitter in a waveform is provided. The method includes conducting a plurality of locally-in-order strobings of the waveform. Changing the acquisition time associated with each locally-in-order strobing. Measuring jitter associated with each locally-in-order strobing and determining jitter as a function of frequency based on the measured jitter associated with each change of acquisition time.
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