发明名称 Immersion lithography fluid control system
摘要 A pattern formation method includes the steps of forming a resist film on a substrate, performing pattern exposure by selectively irradiating the resist film with exposing light with a liquid provided on the resist film, and forming a resist pattern by developing the resist film after the pattern exposure. An electric field or a magnetic is applied to the liquid in the step of performing pattern exposure.
申请公布号 US2007115453(A1) 申请公布日期 2007.05.24
申请号 US20070653835 申请日期 2007.01.17
申请人 NIKON CORPORATION 发明人 COON DEREK;HAZELTON ANDREW J.
分类号 G03B27/32;G03F7/20 主分类号 G03B27/32
代理机构 代理人
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