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发明名称
Ätzlösung zur Bewertung der Kristallfehler.
摘要
申请公布号
DE3850686(D1)
申请公布日期
1994.08.25
申请号
DE19883850686
申请日期
1988.03.02
申请人
KABUSHIKI KAISHA TOSHIBA, KAWASAKI, KANAGAWA, JP
发明人
SAITO, YOSHIHIKO C/O PATENT DIVISION, MINATO-KU TOKYO 105, JP;MATSUSHITA, YOSHIAKI C/O PATENT DIVISION, MINATO-KU TOKYO 105, JP
分类号
H01L21/66;B62L1/00;H01L21/306;H01L21/308;(IPC1-7):H01L21/306
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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