METHOD OF REMOVING SURFACE DEPOSITS FROM REACTION CHAMBERS USING NF3
摘要
<p>The present invention relates to a remote plasma cleaning method for removing surface deposits from a surface, such as the interior of a depositions chamber that is used in fabricating electronic devices. The process involves activating a gas stream comprising an oxygen source, NF<SUB>3</SUB>, and a fluorocarbon and contacting the activated gas mixture with surface deposits to remove the surface deposits.</p>
申请公布号
WO2007059140(A1)
申请公布日期
2007.05.24
申请号
WO2006US44203
申请日期
2006.11.14
申请人
E. I. DU PONT DE NEMOURS AND COMPANY;MASSACHUSETTS INSTITUTE OF TECHNOLOGY;SAWIN, HERBERT, H.;BAI, BO;AN, JU, JIN