Instrument and method for measuring the thickness of a metallic layer deposited on a curved insulating support, particularly a parabolic antenna for radio communications,申请号IT1993MI00933-传众专利搜索

发明名称	Instrument and method for measuring the thickness of a metallic layer deposited on a curved insulating support, particularly a parabolic antenna for radio communications
摘要
申请公布号	IT1264396(B1)	申请公布日期	1996.09.23
申请号	IT1993MI00933	申请日期	1993.05.10
申请人	SIEMENS TELECOMUNICAZIONI S.P.A.	发明人	TOTARO FRANCESCO
分类号	G01B	主分类号	G01B
代理机构		代理人
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