TEST CIRCUIT AND METHOD FOR HIERARCHICAL CORE,申请号EP20050703024-传众专利搜索

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发明名称	TEST CIRCUIT AND METHOD FOR HIERARCHICAL CORE
摘要
申请公布号	EP1787136(A1)	申请公布日期	2007.05.23
申请号	EP20050703024	申请日期	2005.02.22
申请人	NXP B.V.	发明人	GOEL, SANDEEP K.
分类号	G01R31/3185	主分类号	G01R31/3185
代理机构		代理人
主权项
地址

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