发明名称 Scanning capacitance microscope, driving method of the scanning capacitance microscope, and recording medium storing program to implement the method
摘要 Provided are a scanning capacitance microscope, which can be very sensitive to a variation of capacitance between a tip and a sample and can make a clear and accurate measurement by preventing stray capacitance, a method of the scanning capacitance microscope, and a recording medium having embodied thereon a program for the method. The scanning capacitance microscope includes: a resonator including a probe having a cantilever and a tip attached to an end of the cantilever, the resonator resonating according to capacitance between the tip of the probe and a sample; an oscillator generating and applying a signal having a variable frequency to the resonator; and a detector detecting a signal generated by the resonator.
申请公布号 KR100721586(B1) 申请公布日期 2007.05.23
申请号 KR20050062674 申请日期 2005.07.12
申请人 发明人
分类号 H01J37/28 主分类号 H01J37/28
代理机构 代理人
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