发明名称 |
Test output compaction using response shaper |
摘要 |
A test output compaction architecture and method that takes advantage of a response shaper in order to minimize masking of faults during compaction. A response shaper is inserted between a plurality of scan chains and an output compactor. The response shaper receives output responses from scan chains and reshapes the output responses in a manner that minimizes masking of faults by the output compactor.
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申请公布号 |
US7222277(B2) |
申请公布日期 |
2007.05.22 |
申请号 |
US20040985599 |
申请日期 |
2004.11.10 |
申请人 |
NEC LABORATORIES AMERICA, INC. |
发明人 |
WANG SEONGMOON;CHAKRADHAR SRIMAT T.;CHAO CHIA-TSO |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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