发明名称 Test output compaction using response shaper
摘要 A test output compaction architecture and method that takes advantage of a response shaper in order to minimize masking of faults during compaction. A response shaper is inserted between a plurality of scan chains and an output compactor. The response shaper receives output responses from scan chains and reshapes the output responses in a manner that minimizes masking of faults by the output compactor.
申请公布号 US7222277(B2) 申请公布日期 2007.05.22
申请号 US20040985599 申请日期 2004.11.10
申请人 NEC LABORATORIES AMERICA, INC. 发明人 WANG SEONGMOON;CHAKRADHAR SRIMAT T.;CHAO CHIA-TSO
分类号 G01R31/28 主分类号 G01R31/28
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