发明名称 Vacuum prober and vacuum probe method
摘要 In a vacuum prober, a head plate is arranged on a prober chamber. A stage, first moving mechanism, recessed chamber, and sealing member are provided in the prober chamber. The stage is arranged below a probe card. The first moving mechanism vertically moves the stage in at least the Z direction. The recessed chamber has a bottom portion and side portion. A lower camera, an upper camera, and the stage are operated to obtain data for alignment. When the upper end of the side portion of the recessed chamber comes into tight contact with the lower surface of the sealing member and a vacuum mechanism evacuates the recessed chamber, a vacuum chamber is formed. As the chamber has a small capacity, the time required for evacuation can be shortened.
申请公布号 US7221176(B2) 申请公布日期 2007.05.22
申请号 US20050078305 申请日期 2005.03.14
申请人 TOKYO ELECTRON LIMITED 发明人 YOSHIOKA HARUHIKO;TAKEKOSHI KIYOSHI;WATANABE SHINJIRO
分类号 G01R1/06;G01R31/02;G01R31/28;H01L21/66 主分类号 G01R1/06
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