发明名称 Timing analysis method and apparatus
摘要 A timing analysis apparatus reads a net list including connection information and the like of circuit cells of an LSI, delay data for previously storing delay information of the circuit cells, stage count-derating factor dependency and components P, V and T of a derating factor; detects the number of stages of each signal path by a signal path cell counting section; determines a derating factor corresponding to the extent of averaging of random variation of each signal path in accordance with the number of stages of the signal path; and performs timing analysis on the basis of the determined derating factor. Therefore, more realistic and highly accurate timing design can be performed on a large-scale circuit.
申请公布号 US7222319(B2) 申请公布日期 2007.05.22
申请号 US20050101572 申请日期 2005.04.08
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 YONEZAWA HIROKAZU
分类号 G06F17/50;G11C7/00;H01L21/82 主分类号 G06F17/50
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