发明名称 Apparatus and method to align clocks for repeatable system testing
摘要 A method and apparatus using a clock generator with sequential logic to align the phase of a first clock generated on a receiving integrated circuit (IC) chip to a second clock received by the receiving IC chip. One embodiment of the invention involves a method for aligning the phase of a first clock relative to the phase of a second clock, wherein the first clock is provided by a clock generator in a data processing system. The method includes sampling the second clock with a sampling clock, detecting an edge on the second clock, and stretching the first clock to align the phase of the first clock relative to the phase of the second clock. A second embodiment of the invention involves a data processing system including a transmitting chip, a receiving chip, and a clock generator for aligning the phase of a first clock relative to the phase of a second clock, wherein the second clock is received by the receiving chip. The clock generator includes a sampling circuit to sample the second clock with a sampling clock, a circuit to detect an edge on the second clock, and a sequential logic circuit to stretch the first clock to align the phase of the first clock relative to the phase of the second clock and control the clock generator.
申请公布号 US7221126(B1) 申请公布日期 2007.05.22
申请号 US20000561147 申请日期 2000.04.28
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 WILLIAMSON DONALD A.;WICKERAAD JOHN A.
分类号 H04J3/06 主分类号 H04J3/06
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