REPAIR CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE AND METHOD THEREOF,申请号KR20050117258-传众专利搜索

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发明名称	REPAIR CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE AND METHOD THEREOF
摘要
申请公布号	KR100722771(B1)	申请公布日期	2007.05.22
申请号	KR20050117258	申请日期	2005.12.03
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	KIM, HYUNG JIK;JEONG, BYUNG HOON
分类号	G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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