CONTACTOR FOR TESTING OF ELECTRONIC PART AND PROBE UNIT HAVING THEREOF,申请号KR20060024302-传众专利搜索

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发明名称	CONTACTOR FOR TESTING OF ELECTRONIC PART AND PROBE UNIT HAVING THEREOF
摘要
申请公布号	KR100722525(B1)	申请公布日期	2007.05.21
申请号	KR20060024302	申请日期	2006.03.16
申请人	ISC TECHNOLOGY CO., LTD.	发明人	SHIN, JONG CHEON;CHUNG, YOUNG BAE;KIM, KI MIN
分类号	G01R1/02;H05K13/08	主分类号	G01R1/02
代理机构		代理人
主权项
地址

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