发明名称 |
Photolithography tool for manufacturing semiconductor device, has wafer whose patterned portion is immersed in liquid, where liquid`s flow direction is controlled and directed outwardly by manipulating nozzle and drain assemblies |
摘要 |
The tool has nozzle and drain assemblies (106, 108) coupled to a lens and disposed circumferentially opposite each other about the lens. A patterned wafer`s portion is immersed in liquid provided by the nozzle assembly, where flow direction of the liquid is controlled and directed outwardly by manipulating the assemblies. The liquid is introduced along a desired direction between the wafer`s surface disposed on a wafer stage. An independent claim is also included for a method for immersion lithography. |
申请公布号 |
FR2893429(A1) |
申请公布日期 |
2007.05.18 |
申请号 |
FR20050011665 |
申请日期 |
2005.11.17 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO.,LTD. |
发明人 |
GAU TSAI SHENG;CHEN CHUN KUANG;LIU RU GUN;LIN BURN JENG |
分类号 |
G03F7/20;G03B27/42;G03B27/52;H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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