发明名称 Photolithography tool for manufacturing semiconductor device, has wafer whose patterned portion is immersed in liquid, where liquid`s flow direction is controlled and directed outwardly by manipulating nozzle and drain assemblies
摘要 The tool has nozzle and drain assemblies (106, 108) coupled to a lens and disposed circumferentially opposite each other about the lens. A patterned wafer`s portion is immersed in liquid provided by the nozzle assembly, where flow direction of the liquid is controlled and directed outwardly by manipulating the assemblies. The liquid is introduced along a desired direction between the wafer`s surface disposed on a wafer stage. An independent claim is also included for a method for immersion lithography.
申请公布号 FR2893429(A1) 申请公布日期 2007.05.18
申请号 FR20050011665 申请日期 2005.11.17
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO.,LTD. 发明人 GAU TSAI SHENG;CHEN CHUN KUANG;LIU RU GUN;LIN BURN JENG
分类号 G03F7/20;G03B27/42;G03B27/52;H01L21/027 主分类号 G03F7/20
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