| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an IC tester capable of impressing a proper off-set voltage without setting the off-set voltage by a test program, and capable of suppressing an overrange. <P>SOLUTION: The present invention provides the improved IC tester capable of carrying out measurement by subtracting the off-set voltage from an output of a tested object. The tester is provided with a voltage measuring part for measuring the output from the tested object, and a voltage generation part for generating the off-set voltage, based on a measured result measured by the voltage measuring part. <P>COPYRIGHT: (C)2007,JPO&INPIT |
