| 摘要 |
An inspection probe for inspecting characteristics of an electronics device having a plurality of signal lines and a drawing portion to which the plurality of signal lines are drawn to be disposed substantially in parallel with each other, the inspection probe being temporarily connected with the signal lines in inspecting the characteristics of the electronics device, the probe including: a board; a plurality of wiring portions provided on the board, the wiring portions extending for a predetermined length in a direction intersecting the drawing direction of the signal lines when the board is pressed to the drawing portion of the signal lines and being arranged in the drawing direction of the signal lines; and contacting sections provided on the wiring portions at a predetermined pitch, the contacting sections being in contact with the signal lines to which a common inspection signal can be inputted when the wiring portions are pressed on the signal lines while being intersected therewith on the drawing portion of the signal lines to electrically connect the signal lines and the wiring portions. |
