KOMPENSATION VON TESTSIGNALVERSCHLECHTERUNG AUFGRUND EINER FEHLFUNKTION DES ZU TESTENDEN BAUELEMENTS

摘要

An electronic device tester channel transmits a single test signal to multiple terminals of electronic devices under test (DUTs) through a set of isolation resistors. The tester channel employs feedback to automatically adjust the test signal voltage to compensate for affects of faults at any of the DUT terminals to prevent the faults from substantially affecting the test signal voltage.