发明名称 |
METHOD DETERMINING PARAMETERS OF SLOW-WAVE STRUCTURES |
摘要 |
FIELD: measurement technology. SUBSTANCE: method involves excitation of slow- wave structure placed in cylindrical cavity resonator which ends are left open in specified frequency range, measurement and recording of all resonance frequencies f<SB>om1</SB> and Q-factors Q<SB>om1</SB> on these frequencies in specified range. Then length of slow- wave system is shortened by value of <EMI ID=0.345 HE=6 WI=24 TI=CHI> and all resonance frequencies f<SB>om2</SB> in this frequency range are measured again. Moderation factors n<SB>m</SB> on resonance frequencies and electrodynamic parameters of slow-down structure are determined by computation by given formulas and dispersion dependencies a=a(f) are plotted, where a is any electrodynamic parameter while measured resonance frequencies f<SB>om</SB> are taken as argument f. EFFECT: provision for measurement of resonance frequencies by method of electrodynamic parameters needed for design of slow-wave structures. 5 dwg, 4 tbl
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申请公布号 |
RU2136010(C1) |
申请公布日期 |
1999.08.27 |
申请号 |
RU19970121075 |
申请日期 |
1997.12.04 |
申请人 |
SKIJ NAUCHNO-ISSLEDOVATEL'SKIJ INSTITUT EHKSPERIME;MINISTERSTVO ROSSIJSKOJ FEDERATSII PO ATOMNOJ EHNE;ROSSIJSKIJ FEDERAL NYJ JADERNY;RGII;MIN ROSSIJSKOJ FEDERATSII ATOM |
发明人 |
KOROTKIKH B.P.;POMAZKOV A.P. |
分类号 |
G01R27/28;(IPC1-7):G01R27/28 |
主分类号 |
G01R27/28 |
代理机构 |
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