| 摘要 |
Systems and methods are provided for offset correction of images from a flat panel detector. In some embodiments, the apparatus and method develops one or more offset maps, acquired during system idle, for the imaging system at a plurality of exposure windows. In some embodiments, exposure parameters acquired for the imaging system before image acquisition are used to select an offset map to subtract from subsequent X-ray images. In some further embodiments, executable instructions are disclosed for directing a processor to compile one or more offset map and exposure parameters to subtract based on a selected offset map noise elements from X-ray images and thereby minimizing the time between image acquisition and display of processed images.
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