发明名称 Semiconductor integrated circuit timing analysis apparatus timing analysis method and timing analysis program
摘要 OCV coefficients in a path being an analysis target according to the number of gate stages are calculated in a coefficient arithmetically operating unit by canceling off a variation in delay in each gate in accordance with the number of gate stages in the target path, and timing analysis of the target path is performed in a timing analysis unit by using the OCV coefficient with the number of gate stages being considered, whereby a variation degree in the entire path is reduced in accordance with the number of gate stages in the target path, thus making it possible to carry out accurate timing analysis in consideration of the variation in a chip of a semiconductor integrated circuit.
申请公布号 US7219320(B2) 申请公布日期 2007.05.15
申请号 US20040807286 申请日期 2004.03.24
申请人 FUJITSU LIMITED 发明人 KAWANO TETSUO;YOSHIKAWA SATORU;HOSONO TOSHIKATSU;ICHINOSE SHIGENORI;YONEDA TAKASHI
分类号 G06F17/50;G06F9/45;H01L21/82 主分类号 G06F17/50
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