发明名称 Tape package having test pad on reverse surface and method for testing the same
摘要 A tape package in which a test pad is formed on a reverse surface is provided. The test pad is disposed on a reverse surface of a base film through a through hole of the base film. Accordingly, shapes of the test pads are standardized so that a universal probe card can be used. A pitch between the test pads is wide so that the accuracy in an electric test of the tape package is increased. A total length of the tape package is reduced.
申请公布号 US7217990(B2) 申请公布日期 2007.05.15
申请号 US20040753828 申请日期 2004.01.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUNG YE-CHUNG
分类号 G01R31/26;H01L23/495;G01R1/073;G01R31/28;H01L21/60;H01L21/66;H01L23/58;H05K1/00;H05K1/02 主分类号 G01R31/26
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