发明名称 |
Tape package having test pad on reverse surface and method for testing the same |
摘要 |
A tape package in which a test pad is formed on a reverse surface is provided. The test pad is disposed on a reverse surface of a base film through a through hole of the base film. Accordingly, shapes of the test pads are standardized so that a universal probe card can be used. A pitch between the test pads is wide so that the accuracy in an electric test of the tape package is increased. A total length of the tape package is reduced.
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申请公布号 |
US7217990(B2) |
申请公布日期 |
2007.05.15 |
申请号 |
US20040753828 |
申请日期 |
2004.01.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHUNG YE-CHUNG |
分类号 |
G01R31/26;H01L23/495;G01R1/073;G01R31/28;H01L21/60;H01L21/66;H01L23/58;H05K1/00;H05K1/02 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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