发明名称 Plasma process chamber and system
摘要 The present invention relates to a plasma process chamber, which includes: an upper housing having a gas inlet connected to a gas source, and a gas shower head placed in the upper housing; and a lower housing having a gas outlet connected to a vacuum pump, and a substrate provided on the inner bottom of the lower housing. On the substrate is placed a wafer. A plasma reactor is provided between the upper housing and the lower housing of the plasma process chamber. The plasma reactor is provided on the outer circumference of its main body with at least one reactor tube of horseshoe shape. A closed magnetic core is attached to the reactor tube, and a coil is wound on said magnetic core. The coil is connected electrically to an A.C. power. The plasma reactor is placed in the middle area of the plasma process chamber and a plurality of the reactor tubes are provided on the outer circumference of the plasma reactor so that plasma reaction is generated and distributed evenly in the plasma process chamber. Consequently, high density of the plasma can be obtained. Furthermore, the generated plasma ion particles are diffused evenly in the plasma process chamber by the diffusion induction electrodes so that cleaning efficiency can be highly increased in the plasma process chamber.
申请公布号 US7217337(B2) 申请公布日期 2007.05.15
申请号 US20030402927 申请日期 2003.04.01
申请人 CHOI DAE-KYU 发明人 CHOI DAE-KYU
分类号 C23F1/00;H01L21/02;C23C16/00;H01J37/32;H01L21/306 主分类号 C23F1/00
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