发明名称 Collector for EUV light source
摘要 A method and apparatus for debris removal from a reflecting surface of an EUV collector in an EUV light source is disclosed which may comprise the reflecting surface comprises a first material and the debris comprises a second material and/or compounds of the second material, the system and method may comprise a controlled sputtering ion source which may comprise a gas comprising the atoms of the sputtering ion material; and a stimulating mechanism exciting the atoms of the sputtering ion material into an ionized state, the ionized state being selected to have a distribution around a selected energy peak that has a high probability of sputtering the second material and a very low probability of sputtering the first material. The stimulating mechanism may comprise an RF or microwave induction mechanism.
申请公布号 US7217940(B2) 申请公布日期 2007.05.15
申请号 US20040798740 申请日期 2004.03.10
申请人 CYMER, INC. 发明人 PARTLO WILLIAM N.;ALGOTS JOHN MARTIN;BLUMENSTOCK GERRY M.;BOWERING NORBERT;ERSHOV ALEXANDER I.;FOMENKOV IGOR V.;PAN XIAOJIANG
分类号 H01J35/20;G02B5/00;G03F7/20;G21C11/00;G21K1/06;H01J1/50 主分类号 H01J35/20
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