发明名称 RESIST COMPOSITION AND PATTERNING PROCESS
摘要 <p>A hydroxystyrene/indene/alkoxyisobutoxystyrene copolymer having Mw of 1,000-500,000 is formulated as a base resin to give a resist composition, typically chemically amplified positive resist composition. The composition exhibits a high resolution, a satisfactory resist pattern profile after development, and improved etch resistance and is thus suitable as a micropatterning material for the fabrication of VLSI.</p>
申请公布号 KR20070049576(A) 申请公布日期 2007.05.11
申请号 KR20060109347 申请日期 2006.11.07
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 TAKEDA TAKANOBU;WATANABE OSAMU;MANBA DAISUKE;KANEDA TSUGIO
分类号 G03F7/039;G03F7/004 主分类号 G03F7/039
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