| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of judging whether a subtle difference in delay time to be provided by delay circuits is within a standard value, and to provide a method of inspecting the semiconductor device. <P>SOLUTION: The delay circuits DC0, DC1 generate delay data strobe signals IDQS0, IDQS1 each delayed by delay times DT0, DT1 from a data strobe signal TDQS for test. An inverter INV0 outputs a reverse data strobe signal RIDQS0 as a reverse signal delayed by a delay permissible time IT from the delay data strobe signal IDQS0. The reverse data strobe signal RIDQS0 and the delay data strobe signal IDQS1 are input into a NAND gate ND0. If the phase of the delay data strobe signal IDQS1 is delayed at not less than the delay permissible time IT, compared to the phase of the delay data strobe signal IDQS0, a pulse signal PL0 is not output from the NAND gate ND0. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
