| 摘要 |
The present invention discloses a sorting apparatus for the high voltage test of chip capacitors, which comprises: an align/position module, a sucker/transport module, a clamp/test module, and a diverter/store module, wherein the align/position module can simultaneously align multiple chip capacitors; the sucker/transport module can simultaneously suck the multiple chip capacitors and sends them to the clamp/test module for testing; and then, the diverter/store module can separate the chip capacitors according test results. In the present invention, in addition to that multiple chip capacitors can be tested simultaneously, the sucker/transport module can also simultaneously suck the next batch of chip capacitors ready for testing when the clamp/test module are testing the chip capacitors; therefore, the present invention can sort chip capacitors rapidly and promote the sort efficiency.
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