发明名称 PHASE PLATE FOR ELECTRON MICROSCOPE, AND ITS MANUFACTURING METHOD
摘要 Provided is a phase plate for an electron microscope, which can prevent an electron beam loss effectively, can find an application to an acceleration voltage over a wide range from low to high voltages, can go into practical use without being accompanied by difficulty in its manufacture, and can attain an image of a high contrast. The phase plate is constructed by spanning the opening of a support member (14) with either a portion of a magnetic thin-wire ring or a magnetic thin-wire rod (15), and is characterized in that the magnetic thin-wire ring or the magnetic thin-wire rod (15) establishes a vector potential, and in that a phase difference is made between electron beams to pass through the two left and right sides of either the spanning portion of the magnetic thin-wire ring or the magnetic ring-wire rod (15).
申请公布号 WO2007052723(A1) 申请公布日期 2007.05.10
申请号 WO2006JP321910 申请日期 2006.11.01
申请人 NAGAYAMA IP HOLDINGS, LLC;NAGAYAMA, KUNIAKI 发明人 NAGAYAMA, KUNIAKI
分类号 H01J37/295;H01J37/04 主分类号 H01J37/295
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