| 摘要 |
<p>A probe needle for probe card that excels in electric conductivity, corrosion resistance and abrasion resistance, having an appropriate contact force to chip electrode, and that ensures excellent bending workability in production stage, being resistant to bending or breaking in the stage of actual use. There is provided a probe needle for probe card of component formulation comprising 1 to 10 wt.% platinum, 5 to 15 wt.% silver, 10 to 20 wt.% either copper or nickel or sum of both and the rest composed mainly of gold, which probe needle exhibits a tensile strength of 1000 to 1200 N/mm<SUP>2</SUP> and a Vickers hardness (Hv) of 300 to 360.</p> |
