发明名称 MULTIFUNCTIONAL PROBE, MICROFABRICATION DEVICE, AND MICROFABRICATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a multifunctional probe which is adequately available for observation and cutting operations, allows the operator to observe a machining object formed on a sample surface during the observation, and allows the operator to minutely machine only a desired area on a nano-scale during the cutting operations, and to provide a microfabrication device and a microfabrication method. SOLUTION: The multifunctional probe 2 is formed of: a cantilever 10 which is arranged so as to be opposed to the sample surface S1; and a probe portion 13 having a machining probe portion 11 and an observation probe portion 12 which are formed of materials different in hardness, and protrude by the same length from the tip of the cantilever 10 in a mutual opposition and adjacency. The observation probe portion 12 is formed of the material softer than that of the machining probe portion 11 so that the distal end may have a flat surface 12a in parallel with the sample surface S1. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007111805(A) 申请公布日期 2007.05.10
申请号 JP20050304001 申请日期 2005.10.19
申请人 SII NANOTECHNOLOGY INC 发明人 ADACHI TATSUYA
分类号 B82B3/00;B82B1/00;G01Q30/02;G01Q60/38;G01Q80/00;H01J37/30 主分类号 B82B3/00
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