发明名称 ABNORMALITY DETECTION APPARATUS FOR A POWER FEED CIRCUIT
摘要 A single state detector circuit can quickly detect short-circuit and open-circuit abnormalities of a load controlled by a power transistor. A DC power supply, the load and the power transistor are serially connected with one another, so that a switching terminal voltage of the power transistor is binarized into high and low levels by the state detector. The power transistor is linearly controlled by a constant-current control circuit so as to suppress an excessive current, and power supplied to the power transistor is interrupted by an overheat interruption circuit. Upon occurrence of a short-circuit in the load during generation of an energization command, a switching terminal voltage of the power transistor becomes stabilized at a high level without intermittent operation, which is detected by the state detector. Upon occurrence of an open-circuit during generation of a deenergization command, a low switching terminal voltage is detected by the state detector.
申请公布号 US2007103006(A1) 申请公布日期 2007.05.10
申请号 US20060379591 申请日期 2006.04.21
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 ZUSHI YUJI;KANZAKI SHOZO
分类号 H01H83/10;H01H35/00;H02H3/20 主分类号 H01H83/10
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