发明名称 Method of producing a thin layer of crystalline material
摘要 A technique for forming a film of crystalline material, preferably silicon. The technique creates a sandwich structure with a weakened region at a selected depth underneath the surface. The weakened region is a layer of porous silicon with high porosity. The high porosity enclosed layer is formed by (1) forming a porous silicon layer with low porosity on surface of the substrate, (2) epitaxial growth of a non-porous layer over the low-porous layer (3) increasing of porosity of the low-porous layer making the said layer hi-porous, (4) cleaving the semiconductor substrate at said high porous layer. The porosity of the buried low-porous layer is increased by hydrogenation techniques, for example, by processing in hydrogen plasma. The process is preferentially used to produce silicon-on-insulator wafers.
申请公布号 US6806171(B1) 申请公布日期 2004.10.19
申请号 US20020213593 申请日期 2002.08.07
申请人 SILICON WAFER TECHNOLOGIES, INC. 发明人 ULYASHIN ALEXANDER;USENKO ALEXANDER
分类号 H01L21/20;H01L21/205;H01L21/762;(IPC1-7):H01L21/20 主分类号 H01L21/20
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