| 摘要 |
There is provided a DC test apparatus for performing a test by applying a DC voltage and a DC current to an electronic device. The DC test apparatus includes a power supply generating section that generates the DC voltage and the DC current, a current detecting resistance provided in series between the power supply generating section and the electronic device, and a current detecting section that detects a level of the DC current based on a difference in potential between ends of the current detecting resistance. The current detecting section includes a reference resistance that has a smaller temperature coefficient than the current detecting resistance, and a temperature compensating section that detects the level of the DC current by multiplying the difference in potential between the ends of the current detecting resistance with a coefficient determined in accordance with a ratio between a resistance value of the current detecting resistance and a resistance value of the reference resistance.
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