发明名称 |
METHOD FOR FORMING TRENCH ISOLATION STRUCTURE |
摘要 |
<p>This invention provides a base material with a siliceous film, which is free from voids and cracks in the interior of groove(s) in a trench isolation structure and has excellent adhesion between a substrate and a siliceous film, and a process for producing the base material with a siliceous film.</p><p>A trench isolation structure is formed by a method comprising coating a silicon-containing polymer solution onto a substrate having trench isolation groove(s) of which the surface has been continuously covered with a silicon nitride liner film, and heat treating the coated substrate at a temperature of from 900°C to 1200°C. The base material with a siliceous film is provided using the method.</p> |
申请公布号 |
EP1768175(A8) |
申请公布日期 |
2007.05.09 |
申请号 |
EP20050743708 |
申请日期 |
2005.05.30 |
申请人 |
AZ ELECTRONIC MATERIALS USA CORP. |
发明人 |
NAGURA, TERUNO;SHIMIZU, YASUO;ICHIYAMA, MASAAKI |
分类号 |
H01L21/316;H01L21/76;H01L21/762 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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