发明名称 METHOD FOR FORMING TRENCH ISOLATION STRUCTURE
摘要 <p>This invention provides a base material with a siliceous film, which is free from voids and cracks in the interior of groove(s) in a trench isolation structure and has excellent adhesion between a substrate and a siliceous film, and a process for producing the base material with a siliceous film.</p><p>A trench isolation structure is formed by a method comprising coating a silicon-containing polymer solution onto a substrate having trench isolation groove(s) of which the surface has been continuously covered with a silicon nitride liner film, and heat treating the coated substrate at a temperature of from 900°C to 1200°C. The base material with a siliceous film is provided using the method.</p>
申请公布号 EP1768175(A8) 申请公布日期 2007.05.09
申请号 EP20050743708 申请日期 2005.05.30
申请人 AZ ELECTRONIC MATERIALS USA CORP. 发明人 NAGURA, TERUNO;SHIMIZU, YASUO;ICHIYAMA, MASAAKI
分类号 H01L21/316;H01L21/76;H01L21/762 主分类号 H01L21/316
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