| 摘要 |
A test and measurement instrument samples an input digital logic signal to produce logic samples, compresses the logic samples into compression codes, and stores the compression codes into acquisition memory. Compression includes parsing the logic samples into groups and assigning compression codes to those groups, and is performed so as not to lose information about the input digital logic signal's activity. The instrument converts the stored compression codes into a waveform image in display memory and displays the stored waveform image on a display device. |
