| 摘要 |
This invention consists of a system and method to carry out hot and/or cold tests on electronic components, using a small chamber insulated from the outside. The components inside the chamber can be simply moved from the outside, even manually, thus saving time and costs of production. It's possible to insert several components, so as to heat and/or cool them simultaneously and therefore proceed with the test. The chamber includes at least one socket (10), where the test is carried out, connected to an electronic card physically separated from said chamber. This invention also relates to the test chamber so realized.
|
