发明名称 Integrated circuit with integrated test aid sub-circuit
摘要 <p>The circuit has a digital input (12) with a circuit section (34) that includes a current-voltage characteristic that holds a voltage at the input at a defined value in the absence of an input signal. Another circuit section provides an internal signal that is internal to the circuit, where state of the internal signal is not directly provided at an output of the circuit. The circuit section (34) has a control input (36) for a control signal, and is designed to change the current-voltage characteristic when the control signal is present at the control input. An independent claim is also included for a method for testing an integrated circuit.</p>
申请公布号 EP1783779(A1) 申请公布日期 2007.05.09
申请号 EP20060022111 申请日期 2006.10.21
申请人 ATMEL GERMANY GMBH 发明人 HAUSER, CLEMENS
分类号 G11C29/46;G11C29/24;G11C29/44;G11C29/48 主分类号 G11C29/46
代理机构 代理人
主权项
地址