发明名称 BORON-DOPED TITANIUM NITRIDE LAYER FOR HIGH ASPECT RATIO SEMICONDUCTOR DEVICES
摘要 Conductive contacts in a semiconductor structure, and methods for forming the conductive components are provided. The contacts are useful for providing electrical connection to active components beneath an insulation layer in integrated circuits such as memory devices. The conductive contacts comprise boron-doped TiCl4-based titanium nitride, and possess a sufficient level adhesion to the insulative layer to eliminate peeling from the sidewalls of the contact opening and cracking of the insulative layer when formed to a thickness of greater than about 200 angstroms.
申请公布号 KR100715389(B1) 申请公布日期 2007.05.08
申请号 KR20047001585 申请日期 2002.07.30
申请人 发明人
分类号 H01L21/28;H01L21/285;H01L21/3205;H01L21/768;H01L21/8242;H01L23/485;H01L23/52;H01L27/10;H01L27/108;H01L29/78 主分类号 H01L21/28
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