POWER SUPPLY FOR MEASURING NOISE AND NOISE MEASURING METHOD OF SEMICONDUCTOR MEMORY,申请号KR20060040635-传众专利搜索

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发明名称	POWER SUPPLY FOR MEASURING NOISE AND NOISE MEASURING METHOD OF SEMICONDUCTOR MEMORY
摘要
申请公布号	KR100718043(B1)	申请公布日期	2007.05.08
申请号	KR20060040635	申请日期	2006.05.04
申请人	HYNIX SEMICONDUCTOR INC.	发明人	OAK, SEUNG HAN
分类号	H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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