发明名称 Method for fabricating a semiconductor memory cell
摘要 Semiconductor memory cell and also a corresponding fabrication method are described, in which a first or bottom electrode device of the memory element of the semiconductor memory cell according to the invention and the gate electrode device of the underlying field effect transistor as selection transistor of the semiconductor memory cell are formed as the same material region or with a common material region.
申请公布号 US7214587(B2) 申请公布日期 2007.05.08
申请号 US20050074946 申请日期 2005.03.09
申请人 INFINEON TECHNOLOGIES AG 发明人 PINNOW CAY-UWE;SYMANCZYK RALF
分类号 H01L21/336;G11C11/24;H01L21/8239;H01L27/105;H01L27/24 主分类号 H01L21/336
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