发明名称 |
Contactless circuit testing for adaptive wafer processing |
摘要 |
A system and method for measuring circuits on an integrated circuit substrate includes a measurement circuit formed on the integrated circuit substrate that measures at least one characteristic of an integrated circuit. The measurement circuit has a power transfer device including a power transfer component, which receives energy from a source where the source does not make physical contact with the integrated circuit substrate to transfer power to the measurement circuit. Measurements are taken to provide feedback for in-situ adjustments to circuit parameters and responses.
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申请公布号 |
US7215133(B2) |
申请公布日期 |
2007.05.08 |
申请号 |
US20040769115 |
申请日期 |
2004.01.30 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
KWARK YOUNG HOON |
分类号 |
G01R31/36;G01R31/02;G01R31/28;G01R31/311 |
主分类号 |
G01R31/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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