发明名称 Imprinting-damascene process for metal interconnection
摘要 The present invention first obtains a nano-metal line by an e-beam lithography and an electroless plating, and imprints the line into a material with low-K to obtain a damascene metal line with low cost and high throughput, as a future solution for a metallization process for a general low-K metal damascene structure through CMP.
申请公布号 US7214611(B2) 申请公布日期 2007.05.08
申请号 US20050208624 申请日期 2005.08.23
申请人 NATIONAL TSING HUA UNIVERSITY 发明人 LIU JEN FU;HSU YUNG JEN;CHEN JIANN HENG;HUANG FON SHAN
分类号 H01L21/4763 主分类号 H01L21/4763
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