| 摘要 |
A method and arrangement for determining the level of at least two measurement points with a light beam direct along a first direction and being deflected through 90° with respect to the first direction to a second direction, the second direction being rotated through a rotation angle corresponding to the position of the measurement point about an axis which is formed by the first direction. The light beam has a cross-sectional intensity distribution with a preferred direction, and after being deflected to the second direction, falls on a detector surface which is positioned successively at each measurement point, the incidence level of the light beam and the orientation of the preferred direction of the cross-section intensity distribution of the light beam on the detector surface being determined for each measurement point, and the rotation angle for each measurement point being determined from the respective orientation of the preferred direction on the detector surface.
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