| 摘要 |
A CMOS image sensor system includes first and second groups of CMOS sensors each responsive to periodic first and second clock signal edges, the second clock signal edge being out-of-phase with the first clock signal edge. Output signals of the first group of CMOS sensors are coupled to a first group of sampling capacitors, respectively, by a first group of sampling switches. Then output signals of the second group of CMOS sensors are coupled to a second group of sampling capacitors, respectively, by means of a second group of sampling switches. Sampled signals on the second group of sampling capacitors to an input of an ADC, and then sampled signals on the first group of sampling capacitors are coupled to the input of the ADC by means of by multiplexing and sample/hold circuitry. A phase of at least one of the first and second clock signal edges is adjusted in response to calibration information so as to avoid circuit noise from being superimposed on sampled signals coupled to the input of the ADC.
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