发明名称 Method and system of discriminating substrate type
摘要 A method and system for determining a substrate type during a seasoning process is presented. An optical signal is acquired from a process in a plasma processing system, and the optical signal is compared to a pre-determined threshold value. Depending upon the comparison, the substrate type is determined to be of a correct type, or an incorrect type.
申请公布号 US7211196(B2) 申请公布日期 2007.05.01
申请号 US20040809474 申请日期 2004.03.26
申请人 TOKYO ELECTRON LIMITED 发明人 LAM HIEU A.;YUE HONGYU
分类号 H01L21/66;G01L21/30;G01N21/68 主分类号 H01L21/66
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