发明名称 Method and apparatus for reduced wear polishing pad conditioning
摘要 Embodiments of a conditioning head for in-situ conditioning and/or cleaning a processing pad of a CMP, ECMP, or other processing system are provided. In one embodiment, the conditioning head includes a brush disposed in a central cavity. A cleaning fluid is provided through the central cavity of the conditioning head to a processing pad. The brush spins and moves laterally across the surface of the processing pad. The cleaning solution dispensed through the conditioning head dissolves by-products of the processing operation while the brush gently wipes the processing pad. A lip of the conditioning head retains the cleaning fluid and cleaning waste, thereby minimizing contamination of the area outside of the conditioning head. The cleaning waste is removed from the processing pad via passages formed near the outer periphery of the conditioning head.
申请公布号 US7210988(B2) 申请公布日期 2007.05.01
申请号 US20050209167 申请日期 2005.08.22
申请人 APPLIED MATERIALS, INC. 发明人 WANG YAN;TSAI STAN D.;HU YONGQI;LIU FENG Q.;CHEN LIANG-YUH;MAO DAXIN;TRAN HUYEN KAREN;WOHLERT MARTIN S.;JIA RENHE;TIAN YUAN A.
分类号 B24B53/00 主分类号 B24B53/00
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