发明名称 LOW COMPLIANCE TESTER INTERFACE
摘要 AUTOMATIC TEST EQUIPMENT ADAPTED FOR TESTING A PLURALITY OF DEVICES-UNDER-TEST (DUTS) IS DISCLOSED. THE AUTOMATIC TEST EQUIPMENT INCLUDES A MAINFRAME COMPUTER AND A TEST HEAD COUPLED TO THE MAINFRAME COMPUTER. THE TEST HEAD INCLUDES A LOW-PROFILE TESTER INTERFACE (30) HAVING A FIRST INTERFACE BOARD (32) AND A DEVICE BOARD (50). THE DEVICE BOARD (50) ENGAGES CONTACT POINTS ON THE DUTS AND INCLUDES A TOPSIDE. A HARD STOP (70) IS MOUNTED TO THE FIRST INTERFACE BOARD (50) AND DEFINES A REFERENCE PLANE (71). THE HARD STOP (70) IS ADAPTED TO ENGAGE THE DEVICE BOARD (50) TOPSIDE TO VERTICALLY FIX THE DEVICE BOARD (50), POSITIONALLY WITH RESPECT TO THE FIRST INTERFACE BOARD (32). THE AUTOMATIC TEST EQUIPMENT FURTHER INCLUDES A COMPLIANT INTERCONNECT ARRAY (60) ADAPTED FOR COMPRESSION BETWEEN THE FIRST INTERFACE BOARD (30) AND THE DEVICE BOARD (50). (FIGURE 3)
申请公布号 MY129582(A) 申请公布日期 2007.04.30
申请号 MYPI20012284 申请日期 2001.05.15
申请人 TERADYNE, INC. 发明人 DEREK CASTELLANO;KEITH BREINLINGER;KEVIN P. MANNING
分类号 G01R31/00;G01R1/04 主分类号 G01R31/00
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