METHOD OF PREDICTING HIGH-K SEMICONDUCTOR DEVICE LIFETIME,申请号KR20050114147-传众专利搜索

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发明名称	METHOD OF PREDICTING HIGH-K SEMICONDUCTOR DEVICE LIFETIME
摘要
申请公布号	KR100711556(B1)	申请公布日期	2007.04.27
申请号	KR20050114147	申请日期	2005.11.28
申请人		发明人
分类号	H01L21/336;H01L21/02	主分类号	H01L21/336
代理机构		代理人
主权项
地址

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