| 发明名称 |
RRAM controller built in self test memory |
| 摘要 |
An RRAM design having linear BIST memory and rectangular BIST memory, the improvement comprising at least one of the linear BIST memory and the rectangular BIST memory formed only of flipflops and logic cells.
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| 申请公布号 |
US2007091702(A1) |
申请公布日期 |
2007.04.26 |
| 申请号 |
US20050256829 |
申请日期 |
2005.10.24 |
| 申请人 |
NIKITIN ANDREY;NEZNANOV ILYA V;ANDREEV ALEXANDER |
发明人 |
NIKITIN ANDREY;NEZNANOV ILYA V.;ANDREEV ALEXANDER |
| 分类号 |
G11C7/02 |
主分类号 |
G11C7/02 |
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