发明名称 |
METHOD OF FORMING TRENCH TRANSISTOR AND PERTINENT TRENCH TRANSISTOR |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of forming a miniaturized trench gate MOS transistor. <P>SOLUTION: The method of forming a trench transistor includes steps of forming a trench 5 in a semiconductor substrate of a first conductivity type; forming a gate dielectric 20 in the trench 5; providing a first conductive filling material 30' in the trench 5 as gate electrode 30; forming a first source-and-drain region 4 by introducing impurities of a second conductive type into the surface of the substrate 1 alongside the trench 5; etching back the first conductive filling material 30' inside the trench 5 to set back to a given depth; introducing impurities of the second conductivity type into the surface of the substrate 1 in the interior of the trench 5 to form a second drain-and-source region 4'; forming insulating spacers 25, 25' on the first conductive filling material 30' inside the trench 5; and providing a second conductive filling material 30'' inside the trench 5 as an upper part of the gate electrode. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007110110(A) |
申请公布日期 |
2007.04.26 |
申请号 |
JP20060270791 |
申请日期 |
2006.10.02 |
申请人 |
QIMONDA AG |
发明人 |
RICHARD LUYKEN;MOLL HANS-PETER;POPP MARTIN;SCHLOESSER TILL;MARC STRASSER;WEIS ROLF |
分类号 |
H01L29/78;H01L21/8242;H01L27/108 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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